Validation of the Parent Scale for Enrichment Program

Wednesday, March 14, 2012
Poster Area 1 (Foyer Outside Exhibit Hall C) (Convention Center)
Kevin K. Byon1, Thomas A. Baker1, James J. Zhang1, Sedat Sen1, Brian S. Berger1, Luke L. Mao2 and Sophia D. Min1, (1)University of Georgia, Athens, GA, (2)University of Florida, Gainesville, FL

Background/Purpose

To measure parents' satisfaction toward after school programs, Zhang, Lam, Smith, Fleming, and Connaughton (2005) developed the Parent Scale for Enrichment Program (PSEP). Since its development, the PSEP has not been re-validated. The purpose of this study was to examine the psychometric properties of the PSEP.

Method

A total of 3,257 parents of students of 21st CCLC programs responded to a questionnaire that consisted of 20 items under four factors (Program Effect, Program Staff, Program Offering, and Program Assurance). A confirmatory factor analysis (CFA) was employed to examine model fit, construct validity, and reliability. A chi-square difference test was conducted to compare the hypothesized 4-factor model against competing models.

Analysis/Results

The CFA revealed that the 4-factor model fit the data well (χ2= 2256.73, RMSEA = .063, CFI = .95). Additional CFA found poor model fit in the 1-factor model (χ2= 7129.68) and 3-factor model (χ2= 4618.45). Both were eliminated from the subsequent chi-square difference test. The second-order model fit the data well (χ2= 2319.83). The chi-square difference was statistically significant (Δχ2 = 63.1, p < .05), suggesting retention of the 4-factor model. All factor loadings were statistically significant, ranging from .62 to .87, showing a good convergent validity. Discriminant validity was a bit concern as three of six interfactor correlations were above the AVE values of the respective factor (Fornell and Lacker, 1981). Construct reliability for the 4-factor model ranged from .87 to .92, indicating the scale had a good reliability.

Conclusions

Overall, the 4-factor PSEP model displayed promising psychometric properties.